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Volumn 2, Issue , 2005, Pages 1769-1775

Effects of discontinuities and technological fluctuations on the RF performance of BGA packages

Author keywords

[No Author keywords available]

Indexed keywords

BROADBAND NETWORKS; CIRCUIT THEORY; COSTS; ELECTRIC DISTORTION; ELECTROMAGNETIC FIELDS; MICROPROCESSOR CHIPS; MICROWAVE POWER TRANSMISSION; PRINTED CIRCUIT BOARDS; ROBUSTNESS (CONTROL SYSTEMS);

EID: 24644519549     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (17)

References (8)
  • 1
    • 0034248754 scopus 로고    scopus 로고
    • Electrical Modeling of the chip scale ball grid array package at radio frequencies
    • Caggiano, M.F., Barkley, E., Sun, M., Kleban, J.T.,; "Electrical Modeling of the chip scale ball grid array package at radio frequencies", Elsevier Microelectronics Journal 31, 2000, Page(s) 701-709.
    • (2000) Elsevier Microelectronics Journal , vol.31 , pp. 701-709
    • Caggiano, M.F.1    Barkley, E.2    Sun, M.3    Kleban, J.T.4
  • 2
    • 0035521095 scopus 로고    scopus 로고
    • Electrical characterization of a 500 MHz frequency EBGA package
    • Nov.
    • Hamano, T., Ikemoto, Y., "Electrical characterization of a 500 MHz frequency EBGA package", IEEE Transactions on Advanced Packaging Volume: 24, Issue: 4, Nov. 2001, Pages: 534-541.
    • (2001) IEEE Transactions on Advanced Packaging , vol.24 , Issue.4 , pp. 534-541
    • Hamano, T.1    Ikemoto, Y.2
  • 5
    • 0033343787 scopus 로고    scopus 로고
    • Electrical characterization of ball grid array packages from S-parameter measurements below 500 MHz
    • Aug.
    • Jaeyong Jeong, Seungki Nam, Shin Y.S., Kim Y.S., Jichai Jeong, "Electrical characterization of ball grid array packages from S-parameter measurements below 500 MHz", IEEE Transactions on Advanced Packaging, Volume: 22, Issue: 3, Aug. 1999, Pages: 343-347.
    • (1999) IEEE Transactions on Advanced Packaging , vol.22 , Issue.3 , pp. 343-347
    • Jeong, J.1    Nam, S.2    Shin, Y.S.3    Kim, Y.S.4    Jeong, J.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.