Structural and electrical investigations of (Y,Gd)l-xCr 0.8Ga0.2O3

Ionics

Volumn 6, Issue 5-6, 2000, Pages 346-350

  Westphal, D ^a   Laske, A ^b   Jakobs, S ^b   Guth, U ^c  

^a Sensor Research Center Greifswald   (Germany)

^b UNIVERSITY OF GREIFSWALD   (Germany)

^c DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 24644517691     PISSN: 09477047     EISSN: 18620760     Source Type: Journal    
DOI: 10.1007/BF02374151     Document Type: Conference Paper

References (5)

1. S. Jakobs, R. Hartung, U. Lawrenz, P. Sandow, U. Schönauer, U. Guth; Ionics 2, 451 (1996).
2. H. Runge, U. Guth, Int. Conf. On Solid State Ionics; SSI 11; Honolulu (1997); proceedings in press.
3. K.-P. Sandow, S. Jakobs, D. Westphal, S. Thiemann, R. Hartung, U. Schönauer, U. Guth; Ionics 2, 435 (1996).
4. G. Sallavuard, G. Szabo and R.A. Paris; C.R. Acad. Sc. Paris, t. 268, Serie C-1051, (1969).
5. M. Marezio, J.P. Remeika and P.D. Dernier; Inorg. Chem. 7, 1337 (1968).