Trace metal measurements in low ionic strength synthetic solutions by diffusive gradients in thin films

Analytical Chemistry

Volumn 77, Issue 17, 2005, Pages 5440-5446

  Warnken, Kent W ^a   Zhang, Hao ^a   Davison, William ^a  

^a LANCASTER UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION COEFFICIENTS; DIFFUSIVE GELS; SYNTHETIC SOLUTIONS; TRACE METAL MEASUREMENTS;

DIFFUSION; GELS; IONIC STRENGTH; METALS; POLYMERIZATION; SOLUTIONS; TRACE ELEMENTS;

THIN FILMS;

CADMIUM; COPPER; RESIN; SODIUM NITRATE; TRACE METAL; UNCLASSIFIED DRUG; WATER;

ACCURACY; ANALYTICAL ERROR; ARTICLE; CHEMICAL ANALYSIS; CLEANING; CONCENTRATION (PARAMETERS); CONTROL; DEIONIZED WATER; DIFFUSION; DIFFUSION COEFFICIENT; DIFFUSIVE GRADIENT; DIFFUSIVE GRADIENT IN THIN FILM; DONNAN PARTITIONING; FILM; GEL; IONIC STRENGTH; MEASUREMENT; METAL BINDING; PARTITION COEFFICIENT; PH; PHASE TRANSITION; POLYMERIZATION; REPRODUCIBILITY; SAMPLER; STORAGE; SURFACE CHARGE;

CADMIUM; COPPER; DIFFUSION; GELS; HYDROGEN-ION CONCENTRATION; METALS; OSMOLAR CONCENTRATION; SOLUTIONS;

EID: 24644506159     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac050045o     Document Type: Article

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