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Volumn 19, Issue 2, 2002, Pages 53-60
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Assessing the lifetime performance of electronic components by confidence interval
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Author keywords
Confidence interval; Conforming rate; Exponential distribution; Lifetime performance index; Process capability index
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Indexed keywords
ELECTRONICS INDUSTRY;
NORMAL DISTRIBUTION;
PERFORMANCE;
QUALITY ASSURANCE;
CONFIDENCE INTERVAL;
CONFORMING RATE;
EXPONENTIAL DISTRIBUTION;
LIFETIME PERFORMANCE INDEX;
PROCESS CAPABILITY INDEX (PCI);
ELECTRONIC EQUIPMENT;
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EID: 24644506144
PISSN: 10170669
EISSN: 21517606
Source Type: Journal
DOI: 10.1080/10170660209509191 Document Type: Article |
Times cited : (11)
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References (17)
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