Mercer kernels for object recognition with local features

Proceedings - 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2005

Volumn II, Issue , 2005, Pages 223-229

  Lyu, Siwei ^a  

^a Dartmouth Department of Computer Science_Dartmouth College   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONSTRAINT THEORY; DATABASE SYSTEMS; FEATURE EXTRACTION; ROBUSTNESS (CONTROL SYSTEMS);

COMPETITIVE PERFORMANCE; IMAGE DEGRADATIONS; MERCER CONDITION; SEMILOCAL CONSTRAINTS;

OBJECT RECOGNITION;

EID: 24644504191     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2005.223     Document Type: Conference Paper

References (23)

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