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Volumn 2695, Issue , 2003, Pages 356-371

Temporal structure tree in digital linear scale space

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER VISION; DIGITAL COMPUTERS; IMAGE PROCESSING; ONE DIMENSIONAL;

EID: 24644492925     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/3-540-44935-3_25     Document Type: Article
Times cited : (8)

References (10)
  • 1
  • 2
    • 0344495189 scopus 로고
    • Theory on the method of determination of view-point and field of vision during observation and measurement of figure
    • in Japanese
    • Zhao, N.-Y., Iijima, T., Theory on the method of determination of view-point and field of vision during observation and measurement of figure IECE Japan, Trans. D., J68-D, 508-514, 1985 (in Japanese).
    • (1985) IECE Japan, Trans. D. , vol.J68-D , pp. 508-514
    • Zhao, N.-Y.1    Iijima, T.2
  • 3
    • 0001366955 scopus 로고
    • A theory of feature extraction by the tree of stable viewpoints
    • in Japanese
    • Zhao, N.-Y., Iijima, T., A theory of feature extraction by the tree of stable viewpoints. IECE Japan, Trans. D., JG8-D, 1125-1135, 1985 (in Japanese).
    • (1985) IECE Japan, Trans. D. , vol.JG8-D , pp. 1125-1135
    • Zhao, N.-Y.1    Iijima, T.2
  • 5
    • 0020891393 scopus 로고
    • Scale space filtering
    • Witkin, A.P., Scale space filtering, Pros. of 8th IJCAI, 1019-1022, 1993.
    • (1993) Pros. of 8th IJCAI , pp. 1019-1022
    • Witkin, A.P.1
  • 6
    • 0022605087 scopus 로고
    • Scale space theory for zero crossings
    • Yuille, A. L., Poggio, T., Scale space theory for zero crossings, IEEE PAMI, 8, 15-25, 1986.
    • (1986) IEEE PAMI , vol.8 , pp. 15-25
    • Yuille, A.L.1    Poggio, T.2
  • 9
    • 85040296040 scopus 로고
    • Mathematical Studies on Feature Extraction in Pattern Recognition
    • in Japanese
    • Otsu, N., Mathematical Studies on Feature Extraction in Pattern Recognition, Researches of The Electrotechnical Laboratory, 818, 1981 (in Japanese).
    • (1981) Researches of the Electrotechnical Laboratory , vol.818
    • Otsu, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.