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Volumn 252, Issue 1 SPEC. ISS., 2005, Pages 81-84

IR and SFM study of PTCDA thin films on different substrates

Author keywords

DFT calculation; Organic semiconductor; Orientation; Structure

Indexed keywords

INFRARED SPECTROSCOPY; MORPHOLOGY; PROBABILITY DENSITY FUNCTION; SUBLIMATION; SUBSTRATES; THIN FILMS;

EID: 24644491299     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.02.001     Document Type: Conference Paper
Times cited : (15)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.