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Volumn 252, Issue 1 SPEC. ISS., 2005, Pages 81-84
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IR and SFM study of PTCDA thin films on different substrates
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Author keywords
DFT calculation; Organic semiconductor; Orientation; Structure
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Indexed keywords
INFRARED SPECTROSCOPY;
MORPHOLOGY;
PROBABILITY DENSITY FUNCTION;
SUBLIMATION;
SUBSTRATES;
THIN FILMS;
DFT CALCULATIONS;
FILM MORPHOLOGY;
PTCDA THIN FILMS;
SUBSTRATE SURFACE;
SEMICONDUCTING ORGANIC COMPOUNDS;
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EID: 24644491299
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2005.02.001 Document Type: Conference Paper |
Times cited : (15)
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References (13)
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