Optimised reflection imaging for surface roughness analysis using confocal laser scanning microscopy and height encoded image processing

Journal of Physics: Conference Series

Volumn 13, Issue 1, 2005, Pages 426-429

  Tomovich, S J ^a   Peng, Z ^a  

^a JAMES COOK UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 24644487424     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/13/1/098     Document Type: Conference Paper

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