Characterization of oxide layers on amorphous Zr-based alloys by Auger electron spectroscopy with sputter depth profiling

Applied Surface Science

Volumn 252, Issue 1 SPEC. ISS., 2005, Pages 162-166

  Baunack, S ^a   Mudali, U Kamachi ^b   Gebert, A ^a  

^a IFW DRESDEN   (Germany)

^b INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

Author keywords

Auger spectroscopy; Electrochemical analysis; Sputtering

Indexed keywords

ANODIC POLARIZATION; AUGER ELECTRON SPECTROSCOPY; ELECTROCHEMISTRY; MELT SPINNING; OXIDES; OXYGEN; PASSIVATION;

ELECTROCHEMICAL ANALYSIS; METAL INTERFACES; OXIDE LAYERS; OXYGEN BINDING STATES;

ZIRCONIUM ALLOYS;

EID: 24644467739     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.02.026     Document Type: Conference Paper

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