Maximal margin classification for metric spaces

Journal of Computer and System Sciences

Volumn 71, Issue 3, 2005, Pages 333-359

  Hein, Matthias ^a   Bousquet, Olivier ^a   Schölkopf, Bernhard ^a  

^a MAX PLANCK INSTITUTE FOR BIOLOGICAL CYBERNETICS   (Germany)

Author keywords

Classification; Embedding; Maximum margin; Metric spaces; Pattern recognition

Indexed keywords

EMBEDDED SYSTEMS; FUNCTIONS; NEURAL NETWORKS; PATTERN RECOGNITION; VECTORS;

CLASSIFICATION; MAXIMUM MARGIN; METRIC SPACES;

ALGORITHMS;

EID: 24644463278     PISSN: 00220000     EISSN: 10902724     Source Type: Journal    
DOI: 10.1016/j.jcss.2004.10.013     Document Type: Conference Paper

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