Breaking the diffraction limit with dynamic saturation optical microscopy

Applied Physics Letters

Volumn 87, Issue 9, 2005, Pages

  Enderlein, Jörg ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE MICROSCOPY; INDEX VARIATIONS; TEMPORAL MEASUREMENT;

ABERRATIONS; ELECTRON DIFFRACTION; FLUORESCENCE; LASERS; OPTICAL RESOLVING POWER; REFRACTIVE INDEX;

OPTICAL MICROSCOPY;

EID: 24644461722     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2034116     Document Type: Article

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