Analysis of electric field averaging for in situ radiofrequency exposure assessment

IEEE Transactions on Vehicular Technology

Volumn 54, Issue 4, 2005, Pages 1245-1250

  Larchêveque, Emmanuel ^a   Dale, Christian ^a   Wong, Man Faï ^a   Wiart, Joe ^a  

^a ORANGE LABS   (France)

Author keywords

Electromagnetic field exposure; In situ measurement; Local average power; Small scale fading

Indexed keywords

BANDWIDTH; ELECTROMAGNETIC FIELD THEORY; ERROR ANALYSIS; GLOBAL SYSTEM FOR MOBILE COMMUNICATIONS; MATHEMATICAL MODELS; PROBABILITY DISTRIBUTIONS; STATISTICAL METHODS;

ELECTROMAGNETIC FIELD EXPOSURE; LOCAL AVERAGE POWER; SMALL SCALE FADING;

RAYLEIGH FADING;

EID: 24644461521     PISSN: 00189545     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVT.2005.851334     Document Type: Article

References (11)

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