Measurement of molecular order and orientation in nanoscale organic films

Synthetic Metals

Volumn 152, Issue 1-3, 2005, Pages 21-24

  Watts, B ^a   Thomsen, L ^a   Dastoor, P C ^a  

^a UNIVERSITY OF NEWCASTLE   (Australia)

Author keywords

Coatings; Organic inorganic interfaces; Polycrystalline surfaces; X ray absorption spectroscopy

Indexed keywords

ADSORPTION; COATINGS; CONFORMATIONS; MOLECULAR ORIENTATION; SELF ASSEMBLY; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

ORGANIC/INORGANIC COATINGS; POLYCRYSTALLINE SURFACES; X-RAY ABSORPTION FINE STRUCTURE (NEXAFS); X-RAY ABSORPTION SPECTROSCOPY;

THIN FILMS;

EID: 24644457823     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.synthmet.2005.07.099     Document Type: Conference Paper

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