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Volumn 401, Issue 1-2, 2005, Pages 193-196

X-ray photoabsorption and total electron yield of Fe thin films at the L2,3 edge

Author keywords

Fe; Spectroscopy; Synchrotron radiation; Thin film; X ray absorption

Indexed keywords

ABSORPTION SPECTROSCOPY; ELECTRONS; LIGHT ABSORPTION; OPTICAL RESOLVING POWER; SAMPLING; SPECTROSCOPY; SYNCHROTRON RADIATION; THIN FILMS; X RAYS;

NEAR EDGE X-RAY ABSORPTION FINE STRUCTURE (NEXAFS); PHOTOABSORPTION; TOTAL ELECTRON YIELD (TEY); X-RAY ABSORPTION;

IRON ANALYSIS;

EID: 24644457608 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/j.jallcom.2005.02.056 Document Type: Article

Times cited : (16)

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