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Volumn 200, Issue 1-4 SPEC. ISS., 2005, Pages 804-808

Diagnostics of an electrolytic microarc process for aluminium alloy oxidation

Author keywords

Aluminium; Microarc oxidation; Optical emission spectroscopy; Plasma electrolytic oxidation

Indexed keywords

CHARACTERIZATION; CURRENT DENSITY; EMISSION SPECTROSCOPY; IMAGE PROCESSING; OPTICAL VARIABLES MEASUREMENT; OXIDATION; PLASMAS; SCANNING ELECTRON MICROSCOPY;

EID: 24644455960     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2005.01.076     Document Type: Article
Times cited : (122)

References (16)
  • 12
    • 24644502469 scopus 로고    scopus 로고
    • Patent WO 01/81658 A1
    • J. Beauvir, Patent WO 01/81658 A1 (2001).
    • (2001)
    • Beauvir, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.