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Volumn 252, Issue 1 SPEC. ISS., 2005, Pages 252-256

Multivariate data analysis for depth resolved chemical classification and quantification of sulfur in SNMS

Author keywords

Classification; Organic and inorganic compounds; Quantification; SNMS; Sulfur

Indexed keywords

CHEMICAL ANALYSIS; DATA REDUCTION; INFORMATION ANALYSIS; INORGANIC COMPOUNDS; KINETIC ENERGY; MASS SPECTROMETRY; ORGANIC COMPOUNDS; PROBLEM SOLVING;

EID: 24644453836     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.02.010     Document Type: Conference Paper
Times cited : (2)

References (8)
  • 4
    • 0004193732 scopus 로고    scopus 로고
    • VCH Weinheim
    • M. Otto Chemometrie 1997 VCH Weinheim ISBN 3-527-28849-6
    • (1997) Chemometrie
    • Otto, M.1
  • 5
    • 0039652901 scopus 로고
    • Thin film and depth profile analysis
    • H. Oechsner Springer Berlin
    • H. Oechsner Thin film and depth profile analysis H. Oechsner Topics in Current Physics 34 1984 Springer Berlin (Chapter 4)
    • (1984) Topics in Current Physics , vol.34
    • Oechsner, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.