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Volumn 42, Issue 1, 2000, Pages 1-
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Foreword: The enduring tradition of technometrics
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 24644442237
PISSN: 00401706
EISSN: 15372723
Source Type: Journal
DOI: 10.1080/00401706.2000.10485971 Document Type: Article |
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Times cited : (1)
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References (0)
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