Optical studies of shear stress effect on organic thin films

Synthetic Metals

Volumn 152, Issue 1-3, 2005, Pages 421-424

  Inokuchi, M ^a   Nagaoka, A ^a   Yamamoto, M ^a   Shirotani, I ^b   Hayashi, J ^b   Yakushi, K ^c   Kawamura, H ^d   Inokuchi, H ^e  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

^b MURORAN INSTITUTE OF TECHNOLOGY   (Japan)

^c INSTITUTE FOR MOLECULAR SCIENCE   (Japan)

^d UNIVERSITY OF HYOGO   (Japan)

^e JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

Author keywords

Amorphous thin films; Infrared and Raman spectroscopy; Optical absorption and emission spectroscopy; Organic conductors based on radical cation and or anion salt

Indexed keywords

EMISSION SPECTROSCOPY; INFRARED RADIATION; LIGHT ABSORPTION; PLATINUM; RAMAN SPECTROSCOPY; SHEAR STRESS;

AMORPHOUS THIN FILMS; INFRARED AND RAMAN SPECTROSCOPY; OPTICAL ABSORPTION AND EMISSION SPECTROSCOPY;

THIN FILMS;

EID: 24644438314     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.synthmet.2005.07.148     Document Type: Article

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