A fast model of a multiple-pinhole SPECT imaging system

Progress in Biomedical Optics and Imaging - Proceedings of SPIE

Volumn 5749, Issue , 2005, Pages 118-127

  Gross, Kevin ^a,c   Kupinski, Matthew A ^a,b   Hesterman, Jacob Y ^a  

^a Optical Sciences Center   (United States)

^b UNIVERSITY OF ARIZONA   (United States)

^c Department of Radiology ^*  (United States)

Author keywords

Hardware Optimization; Ideal Observer; Lumpy Object; Markov Chain Monte Carlo; SPECT

Indexed keywords

BAYESIAN NETWORKS; DIGITAL IMAGE STORAGE; GAMMA RAYS; IMAGING SYSTEMS; LOCATION; MONTE CARLO METHODS; OPTIMIZATION; OPTOELECTRONIC DEVICES; STATISTICAL TESTS; TECHNOLOGICAL FORECASTING;

HARDWARE OPTIMIZATION; IDEAL OBSERVER; LUMPY OBJECT; MARKOV-CHAIN MONTE CARLO; SPECT;

MEDICAL IMAGING;

EID: 24644433887     PISSN: 16057422     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.595605     Document Type: Conference Paper

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