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Volumn 44, Issue 3, 1991, Pages 1442-1445
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Interface structure and misfit dislocations in thin Cu films on Ru(0001)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 24544467271
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevB.44.1442 Document Type: Article |
Times cited : (108)
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References (14)
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