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Volumn 138, Issue 2, 1999, Pages 323-326
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Electron impact excitation of Si I
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Author keywords
Atomic data; Atomic processes
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Indexed keywords
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EID: 24444450775
PISSN: 03650138
EISSN: None
Source Type: Journal
DOI: 10.1051/aas:1999276 Document Type: Article |
Times cited : (4)
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References (17)
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