Growth characteristics of ZrO2 insulation coatings on Ag/AgMg sheathed Bi-2212 superconducting tapes

Materials Science and Engineering: B

Volumn 110, Issue 2, 2004, Pages 213-220

  Celik, Erdal ^a,b   Avci, Esref ^c   Hascicek, Yusuf S ^b  

^a DOKUZ EYLUL UNIVERSITY   (Turkey)

^b FLORIDA STATE UNIVERSITY   (United States)

^c SAKARYA UNIVERSITY   (Turkey)

Author keywords

AgMg Bi 2212; Critical current; Film growth; HTS conductor; Insulation; Resistance; Sol gel; ZrO2

Indexed keywords

CHELATION; CHEMICAL VAPOR DEPOSITION; CRITICAL CURRENTS; DIFFRACTOMETERS; ELECTRIC RESISTANCE; ENERGY DISPERSIVE SPECTROSCOPY; FILM GROWTH; GELATION; INSULATION; MAGNETIC RESONANCE IMAGING; SCANNING ELECTRON MICROSCOPY; SUPERCONDUCTING TAPES; SURFACE TOPOGRAPHY; TRANSDUCERS; ULTRASONICS; X RAY DIFFRACTION;

HTS CONDUCTOR; INSULATION COATINGS; SOL-GEL;

COATINGS;

EID: 2442698025     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2004.03.011     Document Type: Article

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