A CMOS image sensor with reset level control using dynamic reset current source for noise suppression

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn 47, Issue , 2004, Pages

  Lee, Kwang Hyun ^a   Yoon, Euisik ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

NOISE SUPPRESSION; PIXEL STRUCTURES; RESET NOISE; SUPPLY VOLTAGE;

ANALOG TO DIGITAL CONVERSION; CAPACITANCE; CHARGE TRANSFER; CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; NOISE ABATEMENT; OPTIMIZATION; PHOTODIODES; SPURIOUS SIGNAL NOISE; THRESHOLD VOLTAGE; TRANSISTORS;

IMAGE SENSORS;

EID: 2442691458     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. I. Inoue et al., "Low-Leakage-Current and Low-Operating-Voltage Buried Photodiode for a CMOS Imager," IEEE Trans. on Electron Devices, vol. 50, pp. 43-47, Jan. 2003.
2. B. Fowler et al., "Low Noise Readout using Active Reset for CMOS APS," Proceedings of SPIE Electronic Imaging, vol. 3965, pp. 126-135, Jan. 2000.
3. B. Pain et al., "Reset Noise Suppression in Two-Dimensional CMOS Photodiode Pixels through Column-based Feedback-Reset," IEDM Tech. Dig., pp. 867-870, Dec. 2002.
4. H.-C. Chien et al., "Active Pixel Image Sensor Scale Down in 0.1um CMOS Technology," IEDM Tech. Dig., pp. 871-875, Dec. 2002.