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Volumn 47, Issue , 2004, Pages

Combined linear-logarithmic CMOS image sensor

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE INJECTION; FIXED PATTERN NOISE (FPN); LOGARITHMIC MODES; LOGARITHMIC OPERATIONS;

EID: 2442676382     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (28)

References (4)
  • 1
    • 0033702196 scopus 로고    scopus 로고
    • Wide-dynamic range pixel with combined linear and logarithmic response and increased signal swing
    • Jan
    • E. C. Fox, J. Hynecek, and D.E. Dykaar, "Wide-Dynamic Range Pixel with Combined Linear and Logarithmic Response and Increased Signal Swing," Proc. SPIE, vol 3965, Jan 2000.
    • (2000) Proc. SPIE , vol.3965
    • Fox, E.C.1    Hynecek, J.2    Dykaar, D.E.3
  • 2
    • 0034246307 scopus 로고    scopus 로고
    • A logarithmic response CMOS image sensor with on-chip calibration
    • Aug
    • S. Kavadias, B. Dierickx, D. Scheffer, et al., "A Logarithmic Response CMOS Image Sensor with On-Chip Calibration," IEEE J. Solid-State Circuits, vol 35, pp. 1146-1162, Aug 2000.
    • (2000) IEEE J. Solid-state Circuits , vol.35 , pp. 1146-1162
    • Kavadias, S.1    Dierickx, B.2    Scheffer, D.3
  • 3
    • 0035309921 scopus 로고    scopus 로고
    • A self-calibrating single-chip CMOS camera with logarithmic response
    • Apr
    • M. Loose, K. Mier, and J. Schemmel, "A Self-Calibrating Single-Chip CMOS Camera with Logarithmic Response," IEEE J. Solid-State Circuits, vol. 36, pp. 586-596, Apr 2001.
    • (2001) IEEE J. Solid-state Circuits , vol.36 , pp. 586-596
    • Loose, M.1    Mier, K.2    Schemmel, J.3
  • 4
    • 0034822537 scopus 로고    scopus 로고
    • Modeling, calibration and correction of non-linear illumination-dependent fixed pattern noise in logarithmic CMOS image sensors
    • May
    • D. Joseph and S. Collins, "Modeling, Calibration and Correction of Non-Linear Illumination-Dependent Fixed Pattern Noise in Logarithmic CMOS Image Sensors," IEEE Instrumentation and Measurement Technology Conference, pp. 1296-1301, May2001.
    • (2001) IEEE Instrumentation and Measurement Technology Conference , pp. 1296-1301
    • Joseph, D.1    Collins, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.