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Volumn 805, Issue , 2003, Pages 287-298

Wetting and friction on quasicrystals and related compounds

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; COATINGS; CORRELATION METHODS; CRYSTALLINE MATERIALS; FERMI LEVEL; FRICTION; INTERFACIAL ENERGY; SUBSTRATES; WETTING;

EID: 2442674348     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-805-ll8.6     Document Type: Conference Paper
Times cited : (6)

References (18)
  • 10
    • 84967502448 scopus 로고    scopus 로고
    • World Scientific, Singapore in press
    • J.M. Dubois, Useful Quasicrystals, World Scientific, Singapore (2004), in press.
    • (2004) Useful Quasicrystals
    • Dubois, J.M.1
  • 11
    • 0025206997 scopus 로고
    • The thickness of the oxide layer was measured at Ames Laboratory, Iowa, USA, based on XPS data according to the standard procedure of B.R. Strohmeier, Surf. Interf. Anal. 15 (1990) 51.
    • (1990) Surf. Interf. Anal. , vol.15 , pp. 51
    • Strohmeier, B.R.1
  • 12
    • 85088188177 scopus 로고    scopus 로고
    • note
    • H2o at infinitely small oxide thickness. This point is discussed later in this section of the paper.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.