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Volumn 559, Issue 1, 2004, Pages 40-46
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Stacking behavior of 2-D assemblies of octa-alkoxyl-substituted phthalocyanine studied by scanning tunneling microscopy
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Author keywords
Computer simulations; Growth; Scanning tunneling microscopy; Surface structure, morphology, roughness, and topography
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COMPUTER SIMULATION;
CRYSTAL GROWTH;
MOLECULAR BEAM EPITAXY;
MONOLAYERS;
MORPHOLOGY;
NANOSTRUCTURED MATERIALS;
OPTOELECTRONIC DEVICES;
SCANNING TUNNELING MICROSCOPY;
SURFACE ROUGHNESS;
SURFACE STRUCTURE;
THIN FILMS;
ATOMIC FORCE MICROSCOPY (AFM);
MULTILAYER STRUCTURES;
SCANNING TUNNELING MICROSCOPY (STM);
TOPOGRAPHY;
NITROGEN COMPOUNDS;
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EID: 2442651889
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2004.03.068 Document Type: Article |
Times cited : (10)
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References (16)
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