Protection of audio amplifiers based on temperature measurements in power transistors

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn 47, Issue , 2004, Pages

  Krabbenborg, Benno ^a  

^a NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

AUDIO AMPLIFIERS; ELECTRO-THERMAL SIMULATIONS; GLOBAL DIE TEMPERATURE; LOAD IMPEDENCE; SAFE OPERATING AREA (SOA);

CAPACITANCE; ELECTRIC LOSSES; ELECTRIC POTENTIAL; HEAT RESISTANCE; INTEGRATED CIRCUITS; POWER TRANSMISSION; SENSORS; SHORT CIRCUIT CURRENTS; TEMPERATURE MEASUREMENT; TRANSISTORS;

AMPLIFIERS (ELECTRONIC);

EID: 2442641703     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. E. Benjamin, J. Audio Eng. Soc., vol. 42, no. 9, Sept. 1994.
2. B. Krabbenborg et al., IEEE Trans.CAD, vol. 15, no. 7, July 1996.