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Volumn 373, Issue 1-2, 2004, Pages 231-236
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Microstructural characterization and computer simulation of conductivity in Si 3 N 4 -TiN composites
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Author keywords
Electrical conductivity; Microstructure; Percolation concentration; Si 3 N 4 TiN composites
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Indexed keywords
CERAMIC MATERIALS;
COMPUTER SIMULATION;
ELECTRIC CONDUCTIVITY;
FRACTURE TOUGHNESS;
MATHEMATICAL MODELS;
MICROSTRUCTURE;
ELECTROCONDUCTIVE COMPOSITES;
PERCOLATION CONCENTRATION;
SI3N4-TIN COMPOSITES;
COMPOSITE MATERIALS;
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EID: 2442604167
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2003.10.036 Document Type: Article |
Times cited : (46)
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References (13)
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