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Volumn 373, Issue 1-2, 2004, Pages 231-236

Microstructural characterization and computer simulation of conductivity in Si 3 N 4 -TiN composites

Author keywords

Electrical conductivity; Microstructure; Percolation concentration; Si 3 N 4 TiN composites

Indexed keywords

CERAMIC MATERIALS; COMPUTER SIMULATION; ELECTRIC CONDUCTIVITY; FRACTURE TOUGHNESS; MATHEMATICAL MODELS; MICROSTRUCTURE;

EID: 2442604167     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2003.10.036     Document Type: Article
Times cited : (46)

References (13)
  • 12
    • 18344414966 scopus 로고    scopus 로고
    • Lee S.Y., et al. Key Eng. Mater. 132-136:1997;2056-2059.
    • (1997) Key Eng. Mater. , vol.132-136 , pp. 2056-2059
    • Lee, S.Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.