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Volumn 806, Issue , 2003, Pages 177-182
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Synthesis and characterization of amorphous metallic alloy thin films for MEMS applications
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COMPOSITION;
GRAIN BOUNDARIES;
MICROELECTROMECHANICAL DEVICES;
SCANNING ELECTRON MICROSCOPY;
SPUTTERING;
SURFACE ROUGHNESS;
SYNTHESIS (CHEMICAL);
WEAR RESISTANCE;
X RAY DIFFRACTION ANALYSIS;
ZIRCONIUM ALLOYS;
DEPOSITION PARAMETERS;
MULTICOMPONENT SPUTTERING PROCESS;
NANOINDENTATION;
SURFACE MIGRATION;
AMORPHOUS ALLOYS;
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EID: 2442599975
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-806-mm8.1 Document Type: Conference Paper |
Times cited : (6)
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References (13)
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