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Volumn 28, Issue 3, 2004, Pages 147-164

Computerized Adaptive Testing with Multiple-Form Structures

Author keywords

Automated test assembly; Computerized adaptive testing; Item response theory; Multiple form structures

Indexed keywords


EID: 2442597992     PISSN: 01466216     EISSN: None     Source Type: Journal    
DOI: 10.1177/0146621604263652     Document Type: Review
Times cited : (10)

References (20)
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    • Boekkooi-Timminga, E. (1990). The construction of parallel tests from IRT-based item pools. Journal of Educational Statistics, 15, 129-145.
    • (1990) Journal of Educational Statistics , vol.15 , pp. 129-145
    • Boekkooi-Timminga, E.1
  • 5
    • 0019477279 scopus 로고
    • The Lagrangian relaxation method for solving integer programming problems
    • Fisher, M. L. (1981). The Lagrangian relaxation method for solving integer programming problems. Management Science, 27, 1-18.
    • (1981) Management Science , vol.27 , pp. 1-18
    • Fisher, M.L.1
  • 6
    • 0022031091 scopus 로고
    • An applications oriented guide to Lagrangian relaxation
    • Fisher, M. L. (1985). An applications oriented guide to Lagrangian relaxation. Interfaces, 15, 10-21.
    • (1985) Interfaces , vol.15 , pp. 10-21
    • Fisher, M.L.1
  • 9
    • 0039428213 scopus 로고
    • A theoretical study of two stage testing
    • Lord, F. (1971). A theoretical study of two stage testing. Psychometrika, 36, 227-242.
    • (1971) Psychometrika , vol.36 , pp. 227-242
    • Lord, F.1
  • 11
    • 0032148329 scopus 로고    scopus 로고
    • Some practical examples of computer-adaptive sequential testing
    • Luecht, R. M., & Nungester, R. J. (1998). Some practical examples of computer-adaptive sequential testing. Journal of Educational Measurement, 35(3), 229-249.
    • (1998) Journal of Educational Measurement , vol.35 , Issue.3 , pp. 229-249
    • Luecht, R.M.1    Nungester, R.J.2
  • 15
    • 0000828004 scopus 로고
    • Binary programming and test design
    • Theunissen, T. J. J. M. (1985). Binary programming and test design. Psychometrika, 50, 411-420.
    • (1985) Psychometrika , vol.50 , pp. 411-420
    • Theunissen, T.J.J.M.1
  • 16
    • 0032350534 scopus 로고    scopus 로고
    • Optimal assembly of psychological and educational tests
    • van der Linden, W. J. (1998). Optimal assembly of psychological and educational tests. Applied Psychological Measurement, 22, 195-211.
    • (1998) Applied Psychological Measurement , vol.22 , pp. 195-211
    • Van Der Linden, W.J.1
  • 19
    • 84988141297 scopus 로고
    • Item clusters and computerized adaptive testing: A case for testlets
    • Wainer, H., & Kiely, G. L. (1987). Item clusters and computerized adaptive testing: A case for testlets. Journal of Educational Measurement, 24, 185-201.
    • (1987) Journal of Educational Measurement , vol.24 , pp. 185-201
    • Wainer, H.1    Kiely, G.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.