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Volumn 558, Issue 1-3, 2004, Pages 211-217
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Faceting of homoepitaxial MgO(1 1 0) layers prepared by electron beam evaporation
b
HITACHI LTD
(Japan)
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Author keywords
Atomic force microscopy; Epitaxy; Faceting; Growth; Magnesium oxides; Reflection high energy electron diffraction (RHEED)
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Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
CRYSTAL STRUCTURE;
DEPOSITION;
EPITAXIAL GROWTH;
HIGH ENERGY ELECTRON DIFFRACTION;
INTERFACIAL ENERGY;
MORPHOLOGY;
NANOSTRUCTURED MATERIALS;
NUCLEATION;
SURFACE STRUCTURE;
SURFACES;
AU COLLOIDS;
ELECTRON BEAM EVAPORATION;
FACETING;
ROCK-SALT;
MAGNESIA;
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EID: 2442580821
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2004.04.002 Document Type: Article |
Times cited : (16)
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References (11)
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