Reflection polarized light microscopy and its application to pyrolytic carbon deposits

Journal of Applied Physics

Volumn 95, Issue 9, 2004, Pages 5192-5199

  Bortchagovsky, E G ^a  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CARBON; COMPUTATIONAL METHODS; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; MICROSCOPIC EXAMINATION; MORPHOLOGY; OPTICAL PROPERTIES; PYROLYSIS; SINGLE CRYSTALS;

PYROLYTIC CARBON DEPOSITS; SINGLE CRYSTALLINE GRAPHITE; TRANSPARENT MATERIALS;

LIGHT POLARIZATION;

EID: 2442573845     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1691185     Document Type: Article

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