Atomic-force microscopy finds new role in the nano world

Laser Focus World

Volumn 40, Issue 4, 2004, Pages 87-91

  Kincade, Kathy ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

MATERIALS SCIENCE; NANOTECHNOLOGY; PHOTODIODES; PRODUCT DEVELOPMENT; SCANNING ELECTRON MICROSCOPY; THICK FILMS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

SURFACE CHARACTERIZATION; SURFACE IMAGING; THICK FILM COATINGS; THIN FILM COATINGS;

ATOMIC FORCE MICROSCOPY;

EID: 2442570986     PISSN: 10438092     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (4)

1. M.Serry, Laser Focus World (June 2002).
2. www.brightsurf.com (Sept. 10, 2003).
3. Kowalewski et al., J. Molecular Biology 335(4) 997 (Jan. 23, 2004).
4. S.R. Nettikadan et al., Nanotechnology 15, 383 (March 2004).