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Volumn 219-220, Issue 1-4, 2004, Pages 680-685

Heavy ion elastic recoil detection analysis of silicon-rich silica films

Author keywords

Elastic recoil detection; Ion beam analysis; Nanocrystals

Indexed keywords

CRYSTALS; ELASTICITY; ION BEAMS; NANOSTRUCTURED MATERIALS; NITROGEN; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; QUANTUM THEORY; SILICA; SILICON COMPOUNDS;

EID: 2442566471     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.01.142     Document Type: Conference Paper
Times cited : (4)

References (12)
  • 12
    • 2442569636 scopus 로고    scopus 로고
    • S.K. Shrestha, K.S.A. Butcher, M. Wintrebert-Fouquet, H. Timmers, these Proceedings
    • S.K. Shrestha, K.S.A. Butcher, M. Wintrebert-Fouquet, H. Timmers, these Proceedings.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.