Using a minimal number of resets when testing from a finite state machine

Information Processing Letters

Volumn 90, Issue 6, 2004, Pages 287-292

  Hierons, R M ^a  

^a BRUNEL UNIVERSITY   (United Kingdom)

Author keywords

Finite state machine; Graph algorithms; Minimization; Reset; Test generation algorithm

Indexed keywords

ALGORITHMS; CONTROL SYSTEMS; DATA PROCESSING; GRAPH THEORY; MATHEMATICAL MODELS; PROBLEM SOLVING; SYSTEMS ENGINEERING; THEOREM PROVING;

FINITE STATE MACHINES (FSM); GRAPH ALGORITHMS; RESET; TEST GENERATION ALGORITHMS;

FINITE AUTOMATA;

EID: 2442565962     PISSN: 00200190     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ipl.2004.03.003     Document Type: Article

References (9)

1. Aho A.V., Dahbura A.T., Lee D., Uyar M.U. An optimization technique for protocol conformance test generation based on UIO sequences and Rural Chinese Postman Tours. Protocol Specification, Testing, and Verification VIII, Atlantic City. 1988;75-86 Elsevier/North-Holland, Amsterdam.
2. Broekman B., Notenboom E. Testing Embedded Software. 2003;Addison-Wesley, London.
3. Fujiwara S., von Bochmann G., Khendek F., Amalou M., Ghedamsi A. Test selection based on finite state models. IEEE Trans. Software Engrg. 17:(6):1991;591-603.
4. Gibbons A. Algorithmic Graph Theory. 1985;Cambridge University Press, Cambridge.
5. Lee D., Yannakakis M. Principles and methods of testing finite-state machines. Proc. IEEE. 84:(8):1996;1089-1123.
6. Moore E.P. Gedanken-Experiments. Shannon C., McCarthy J. Automata Studies. 1956;Princeton University Press, Princeton, NJ.
7. Petrenko A., Yevtushenko N., von Bochmann G. Testing deterministic implementations from nondeterministic FSM specifications. Testing of Communicating Systems, Darmstadt, Germany. 1996;125-141 Chapman and Hall.
8. Sidhu D.P., Leung T.-K. Formal methods for protocol testing: A detailed study. IEEE Trans. Software Engrg. 15:(4):1989;413-426.
9. Yao M., Petrenko A., von Bochmann G. Conformance testing of protocol machines without reset. Protocol Specification, Testing and Verification, XIII (C-16). 1993;241-256 Elsevier/North-Holland, Amsterdam.