Interface delamination of layered media: Acoustic spectroscopy and modal analysis

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 51, Issue 4, 2004, Pages 439-443

  Hirao, Masahiko ^a   Ogi, Hirotsugu ^a   Sato, Keiji ^a,b  

^a OSAKA UNIVERSITY   (Japan)

^b IBM JAPAN LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACE DELAMINATION; LASER-DOPPLER INTERFERROMETRY; RESONANCE ULTRASOUND SPECTROSCOPY (RUS); STRAIN ENERGY;

ACOUSTIC SPECTROSCOPY; ANISOTROPY; APPROXIMATION THEORY; BOUNDARY CONDITIONS; CONTINUOUS WAVE LASERS; DELAMINATION; FLIP CHIP DEVICES; INTERFEROMETRY; INTERPOLATION; NATURAL FREQUENCIES; STRAIN; STRESS CONCENTRATION;

PIEZOELECTRIC MATERIALS;

EID: 2442549744     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2004.1295429     Document Type: Article

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