SCOPUS 정보 검색 플랫폼

Journal of Applied Physics

Volumn 95, Issue 9, 2004, Pages 5010-5013

Spectral and spatial narrowing of the emission of silicon nanocrystals in a microcavity

(6) Amans, D a,c Callard, S a Gagnaire, A a Joseph, J a Huisken, F b,d Ledoux, G b,e

a ECOLE CENTRALE DE LYON (France)

b MAX PLANCK INSTITUTE FOR DYNAMICS AND SELF ORGANIZATION (Germany)

c UNIVERSITÉ LIBRE DE BRUXELLES (Belgium)

d MAX PLANCK INSTITUT FÜR ASTRONOMIE (Germany)

e UNIVERSITÉ LYON 1 (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; ENERGY GAP; FABRICATION; LIGHT SOURCES; LIGHT TRANSMISSION; MICROELECTRONICS; MONOCHROMATORS; MULTILAYERS; PHOTOLUMINESCENCE; SILICON;

EMISSON BANDS; MICROCAVITY; QUANTUM CONFINEMENT EFFECTS; SPATIAL NARROWING;

NANOSTRUCTURED MATERIALS;

EID: 2442537064 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1669073 Document Type: Article

Times cited : (16)

References (14)

1
- 0141775174
- L. T. Canham, Appl. Phys. Lett. 57, 1046 (1990).
- (1990) Appl. Phys. Lett. , vol.57 , pp. 1046
- Canham, L.T.¹

2
- 1842595981
- V. Lehmann and U. Gösele, Appl. Phys. Lett. 58, 856 (1991).
- (1991) Appl. Phys. Lett. , vol.58 , pp. 856
- Lehmann, V.¹ Gösele, U.²

3
- 0000349868
- M. Ehbrecht and F. Huisken, Phys. Rev. B 59, 2975 (1999).
- (1999) Phys. Rev. B , vol.59 , pp. 2975
- Ehbrecht, M.¹ Huisken, F.²

4
- 0034670807
- G. Ledoux, O. Guillois, D. Porterat, C. Reynaud, F. Huisken, B. Kohn, and V. Paillard, Phys. Rev. B 62, 15 942 (2000).
- (2000) Phys. Rev. B , vol.62
- Ledoux, G.¹ Guillois, O.² Porterat, D.³ Reynaud, C.⁴ Huisken, F.⁵ Kohn, B.⁶ Paillard, V.⁷

5
- 0347053431
- M. A. Laguna, V. Paillard, B. Kohn, M. Ehbrecht, F. Huisken, G. Ledoux, R. Papoular, and H. Hofmeister, J. Lumin. 80, 223 (1999).
- (1999) J. Lumin. , vol.80 , pp. 223
- Laguna, M.A.¹ Paillard, V.² Kohn, B.³ Ehbrecht, M.⁴ Huisken, F.⁵ Ledoux, G.⁶ Papoular, R.⁷ Hofmeister, H.⁸

6
- 79956021606
- G. Ledoux, J. Gong, F. Huisken, O. Guillois, and C. Reynaud, Appl. Phys. Lett. 80, 4834 (2002).
- (2002) Appl. Phys. Lett. , vol.80 , pp. 4834
- Ledoux, G.¹ Gong, J.² Huisken, F.³ Guillois, O.⁴ Reynaud, C.⁵

7
- 0037005971
- G. Ledoux, D. Amans, J. Gong, F. Huisken, F. Cichos, and J. Martin, Mater. Sci. Eng., C 19, 215 (2002).
- (2002) Mater. Sci. Eng., C , vol.19 , pp. 215
- Ledoux, G.¹ Amans, D.² Gong, J.³ Huisken, F.⁴ Cichos, F.⁵ Martin, J.⁶

8
- 0000018089
- B. Masenelli, A. Gagnaire, L. Berthelot, J. Tardy, and J. Joseph, J. Appl. Phys. 85, 3032 (1999).
- (1999) J. Appl. Phys. , vol.85 , pp. 3032
- Masenelli, B.¹ Gagnaire, A.² Berthelot, L.³ Tardy, J.⁴ Joseph, J.⁵

9
- 0033899059
- B. Masenelli, S. Callard, A. Gagnaire, and J. Joseph, Thin Solid Films 364, 264 (2000).
- (2000) Thin Solid Films , vol.364 , pp. 264
- Masenelli, B.¹ Callard, S.² Gagnaire, A.³ Joseph, J.⁴

10
- 0035875266
- F. Iacona, G. Franzò, E. C. Moreira, and F. Priolo, J. Appl. Phys. 89, 8354 (2001).
- (2001) J. Appl. Phys. , vol.89 , pp. 8354
- Iacona, F.¹ Franzò, G.² Moreira, E.C.³ Priolo, F.⁴

11
- 0000009675
- V. Pellegrini, A. Tredicucci, C. Mazzoleni, and L. Pavesi, Phys. Rev. B 52, 14328 (1995).
- (1995) Phys. Rev. B , vol.52 , pp. 14328
- Pellegrini, V.¹ Tredicucci, A.² Mazzoleni, C.³ Pavesi, L.⁴

12
- 0000402625
- M. Ehbrecht, B. Kohn, F. Huisken, M. A. Laguna, and V. Paillard, Phys. Rev. B 56, 6958 (1997).
- (1997) Phys. Rev. B , vol.56 , pp. 6958
- Ehbrecht, M.¹ Kohn, B.² Huisken, F.³ Laguna, M.A.⁴ Paillard, V.⁵

13
- 0003808259
- North Holland
- R. M. A. Azzam and N. M. Basharra, Ellipsometry and Polarized Light
- (1977) Ellipsometry and Polarized Light
- Azzam, R.M.A.¹ Basharra, N.M.²

14
- 0037391027
- D. Amans, S. Callard, A. Gagnaire, J. Joseph, G. Ledoux, and F. Huisken, J. Appl. Phys. 93, 4173 (2003).
- (2003) J. Appl. Phys. , vol.93 , pp. 4173
- Amans, D.¹ Callard, S.² Gagnaire, A.³ Joseph, J.⁴ Ledoux, G.⁵ Huisken, F.⁶

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.