Experimental measurements of surface residual stress caused by nano-scale contact of rough surfaces

Materials Research Society Symposium - Proceedings

Volumn 795, Issue , 2003, Pages 375-380

  Wang, J ^a   Shrotriya, P ^a   Yu, H H ^a   Kim, K S ^a  

^a Brown University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT LOADING; DISLOCATION SEGREGATION; NANO-SCALE CONTACTS; WEAR RATES;

ALUMINUM; ATOMIC FORCE MICROSCOPY; DELAMINATION; DISLOCATIONS (CRYSTALS); INTERFEROMETERS; PLASTIC DEFORMATION; POLYCRYSTALLINE MATERIALS; SENSITIVITY ANALYSIS; STRESS CONCENTRATION; SURFACE ROUGHNESS; TENSILE STRESS; WEAR OF MATERIALS;

RESIDUAL STRESSES;

EID: 2442530712     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: 10.1557/proc-795-u9.9     Document Type: Article

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