SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 804, Issue , 2003, Pages 3-14

High-throughput screening of thermoelectric materials; application of thermal probe method to composition-spread samples

(5) Yamamoto, Atsushi a Kukuruznyak, Dmitry b Ahmet, Parhat b Chikyow, Toyohiro b Ohuchi, Fumio S c

a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST (Japan)

b NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

c University of Washington (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH ALLOYS; COMPOSITION; DOPING (ADDITIVES); ELECTRIC RESISTANCE; POWDER METALLURGY; PULSED LASER DEPOSITION; SEEBECK EFFECT; THERMAL CONDUCTIVITY; THERMISTORS; THERMOELECTRIC ENERGY CONVERSION;

CONTACT RESISTANCE; PSEUDO TERNARY DIAGRAMS; THERMAL PROBES; THERMOELECTRIC MATERIALS;

BINARY ALLOYS;

EID: 2442501273 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: 10.1557/proc-804-jj1.4 Document Type: Conference Paper

Times cited : (7)

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