Evaluating reliability improvements of fault tolerant array processors using algorithm-based fault tolerance

IEEE Transactions on Computers

Volumn 46, Issue 6, 1997, Pages 725-730

  Tao, D L ^a   Kantawala, Kamal ^a  

^a Stony Brook University   (United States)

Author keywords

Array processors; Error detecting correcting codes; Fault tolerance; Multiprocessor system; Reliability

Indexed keywords

EID: 2442491504     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.600889     Document Type: Review

References (23)

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