Crystallographic features of rhenium disilicide

Materials Research Society Symposium - Proceedings

Volumn 793, Issue , 2003, Pages 305-310

  Tanaka, K ^a   Inui, H ^b   Ohba, T ^c   Tsutsui, S ^d   Mizumaki, M ^d  

^a KAGAWA UNIVERSITY   (Japan)

^b KYOTO UNIVERSITY   (Japan)

^c SHIMANE UNIVERSITY   (Japan)

^d JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; CRYSTALLOGRAPHY; DENSITY (SPECIFIC GRAVITY); LATTICE CONSTANTS; SILICON COMPOUNDS; SINGLE CRYSTALS; SYNCHROTRON RADIATION; X RAY POWDER DIFFRACTION;

HIGH ANGLE ANNULAR DARK FIELD (HAADF) IMAGING; SILICON ATOMS; SPACE GROUP; THERMOELECTRIC MATERIALS;

RHENIUM COMPOUNDS;

EID: 2442490936     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-793-s8.31     Document Type: Conference Paper

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