Pressure dependence of conductivity of fullerite structures

Proceedings - KORUS 2003: 7th Korea-Russia International Symposium on Science and Technology

Volumn 1, Issue , 2003, Pages 141-146

  Berdinsky, A S ^a   Fink, D ^b   Petrov, A V ^b,e,f   Chuh, Hei Gon ^c   Chadderton, L T ^d   Gridchin, V A ^a   Alegaonkar, P S ^g  

^a NOVOSIBIRSK STATE TECHNICAL UNIVERSITY   (Russian Federation)

^b HAHN MEITNER INSTITUT   (Germany)

^c University of Ulsan   (South Korea)

^d AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^e INSTITUTE OF SOLID STATE AND SEMICONDUCTOR PHYSICS   (Belarus)

^f UNIVERSITY OF HAGEN   (Germany)

^g UNIVERSITY OF PUNE   (India)

Author keywords

Australia; Conductivity; Contacts; Etching; Glass; Polymer films; Powders; Silver; Solid state circuits; Temperature sensors

Indexed keywords

CONTACTS (FLUID MECHANICS); ELECTRIC CONDUCTIVITY; ETCHING; GLASS; HEAVY IONS; POWDERS; SILVER; SOLID-STATE SENSORS; TEMPERATURE SENSORS;

APPLIED PRESSURE; AUSTRALIA; NANOTUBULES; POLYMER FOIL; PRESSURE DEPENDENCE; SOLID-STATE CIRCUITS; SWIFT HEAVY ION TRACKS; THIN GLASS;

POLYMER FILMS;

EID: 2442476699     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. A S.Berdinsky, Y.V.Shevtsov, A. V.Okotrub, S.V.Trubin, L.T.Chadderton, D.Fink, J.H. Lee// Sensor Properties of Fullerene Films and Fullerene Compounds with Iodine//Chemistry for Sustainable Development 8 (2000), 141-146.
2. A.S. Berdinsky, D. Fink, A.V. Petrov, Chuh H.G., L.T. Chadderton, P.S. Alegaonkar //Conducting Properties of Planar Irradiated and Pristine Si-Fullerite-Metal-Structures (Private communication).
3. Berdinsky A.S., Fink D., Petrov A.V., Müller M., Chadderton L. T., Chubaci J.F. and Tabacniks M. H. Formation and Conductive Properties of Miniaturized Fullerite Sensors // MRS Fall Meeting, November 26-30 in Boston, Massachusetts, Boston, USA, 2001.
4. 60 films// International Symposium on Carbon, Science and Technology of New Carbons.- Tokyo.- Tanzo.- 1998.- p.540-541.
5. J.Vacik, J.Cervena, V.Hnatowicz, D.Fink, and R.Klett, New technique for nondestructing examination of latent track etching; Rad. Eff. Def. Solids 140 (1997) 307.