Hall effect measurements on new thermoelectric materials

Materials Research Society Symposium - Proceedings

Volumn 793, Issue , 2003, Pages 323-332

  Short, Jarrod ^a   Loo, Sim ^a   Lal, Sangeeta ^a   Hsu, Kuei Fang ^b   Quarez, Eric ^b   Kanatzidis, Mercouri G ^b   Hogan, Timothy P ^a  

^a Michigan State University   (United States)

^b MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CARRIER MOBILITY; ELECTRIC CONDUCTIVITY; HALL EFFECT; TEMPERATURE CONTROL; THERMAL CONDUCTIVITY;

MATERIAL PROPERTIES; TEMPERATURE DEPENDENCE; THERMOELECTRIC POWER;

THERMOELECTRIC EQUIPMENT;

EID: 2442445155     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-793-s8.35     Document Type: Conference Paper

References (7)

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