Gassing arc chamber wall material effect on post current-zero recovery voltage breakdown

IEEE Transactions on Components and Packaging Technologies

Volumn 27, Issue 1, 2004, Pages 42-50

  Shea, John J ^a  

^a EATON CORPORATION   (United States)

Author keywords

Arcing; Breakdown; Circuit breaker; Current zero; Gassing walls; High current; Plasma; Recovery voltage

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRIC INSULATION; NUMERICAL ANALYSIS; PRESSURE EFFECTS; PYROLYSIS;

ARCING; GASSING ARC CHAMBER WALL MATERIAL EFFECT; MOLDED CASE CIRCUIT BREAKER;

CIRCUIT BREAKING ARCS;

EID: 2442436479     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAPT.2004.825783     Document Type: Article

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