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Volumn 793, Issue , 2003, Pages 181-186
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Development of experimental techniques for thermoelectric properties characterization of low-dimensional structures
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Author keywords
[No Author keywords available]
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Indexed keywords
BOUNDARY CONDITIONS;
ELECTRIC POTENTIAL;
ELECTRODES;
NANOSTRUCTURED MATERIALS;
SAMPLING;
SCANNING;
SENSORS;
THERMAL CONDUCTIVITY;
HEAT LEAKAGE;
LOW-DIMENSIONAL STRUCTURES;
SPATIAL RESOLUTION;
VOLTAGE DROP;
SEEBECK EFFECT;
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EID: 2442419975
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-793-s7.5 Document Type: Conference Paper |
Times cited : (3)
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References (8)
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