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Volumn 18, Issue 2, 2005, Pages
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Improved pinning by multiple in-line damage
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Author keywords
[No Author keywords available]
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Indexed keywords
ESTIMATION;
MATHEMATICAL MODELS;
SUPERCONDUCTING MATERIALS;
SUPERCONDUCTIVITY;
COLUMNAR DEFECTS;
COLUMNAR PINNING;
MULTIPLE IN-LINE DAMAGE (MILD);
PINNING POTENTIAL;
CRYSTAL DEFECTS;
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EID: 24344508197
PISSN: 09532048
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-2048/18/2/038 Document Type: Conference Paper |
Times cited : (13)
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References (19)
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