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Volumn 31, Issue 2, 2005, Pages 101-112
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Substrate temperature dependence on the optical properties of Cu and Ag thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
COPPER;
METALLIC FILMS;
MICROSTRUCTURE;
PERMITTIVITY;
REFLECTION;
SILVER;
SPECTROPHOTOMETRY;
SUBSTRATES;
TEMPERATURE DISTRIBUTION;
VOLUME FRACTION;
FREQUENCY DEPENDENCE;
GLASS SUBSTRATES;
METALLIC GRAINS;
SUBSTRATE TEMPERATURE;
THIN FILMS;
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EID: 24344467895
PISSN: 12860042
EISSN: None
Source Type: Journal
DOI: 10.1051/epjap:2005053 Document Type: Article |
Times cited : (25)
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References (47)
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