Development of poly(propylene) surface topography during corona treatment

Plasma Processes and Polymers

Volumn 2, Issue 7, 2005, Pages 547-553

  Jones, Viv ^a   Strobel, Mark ^a   Prokosch, Michael J ^a  

^a 3M COMPANY   (United States)

Author keywords

Atomic force microscopy (AFM); Contact angle (CA); Dielectric barrier discharges (DBD); ESCA XPS; Low molecular weight oxidized material

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; ELECTRIC CORONA; ELECTRIC DISCHARGES; MOLECULAR WEIGHT; SCANNING ELECTRON MICROSCOPY; SURFACE TOPOGRAPHY; X RAY PHOTOELECTRON SPECTROSCOPY;

CONTACT ANGLE MEASUREMENTS; DIELECTRIC BARRIER DISCHARGES (DBD); LOW MOLECULAR WEIGHT OXIDIZED MATERIAL;

POLYPROPYLENES;

EID: 24344460954     PISSN: 16128850     EISSN: None     Source Type: Journal    
DOI: 10.1002/ppap.200500033     Document Type: Article

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