Ion crater healing and variable temperature ellipsometry as complementary probes for the glass transition in thin polymer films

European Physical Journal E

Volumn 12, Issue SUPPL. 1, 2003, Pages 69-73

  Grohens, Y ^a   Papaleo R M ^b   Hamon, L ^c  

^a UNIVERSITÉ DE BRETAGNE SUD   (France)

^b PONTIFICAL CATHOLIC UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

^c UNIVERSITÉ D EVRY VAL D ESSONNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; GLASS TRANSITION; ISOMERS; POLYMETHYL METHACRYLATES; THERMAL EXPANSION;

ION CRATER HEALING; SCANNING FORCE MICROSCOPY (SFM); STEREOISOMERS;

ELLIPSOMETRY;

EID: 24344442902     PISSN: 12928941     EISSN: None     Source Type: Journal    
DOI: 10.1140/epje/i2003-10028-4     Document Type: Article

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