Photon scanning tunneling microscope combined with atomic force microscope

Guangxue Xuebao/Acta Optica Sinica

Volumn 25, Issue 8, 2005, Pages 1099-1104

  Wu, Shifa ^a   Zhang, Jian ^a   Pan, Shi ^a   Jian, Guoshu ^a   Li, Yinli ^a   Sun, Wei ^a   Wang, Xiaoqiu ^a   Huang, Yuqi ^a   Song, Linfeng ^a   Zhang, Yi ^a  

^a DALIAN UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

Atomic force microscope (AFM); Microscopy; Photo scanning tunneling microscopy (PSTM); Scanning near field optical microscope (SNOM); Superresolution

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; DIFFRACTION; IMAGING SYSTEMS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; REFRACTIVE INDEX;

PHOTO SCANNING TUNNELING MICROSCOPY; SCANNING NEAR FIELD OPTICAL MICROSCOPE; SUPERRESOLUTION;

OPTICAL MICROSCOPY;

EID: 24344442347     PISSN: 02532239     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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